Growth of Bi thin films on quasicrystal surfaces
| Title | Growth of Bi thin films on quasicrystal surfaces |
| Publication Type | Journal Article |
| Year of Publication | 2008 |
| Authors | Sharma HR, Fournee V, Shimoda M, Ross AR, Lograsso TA, Gille P, Tsai AP |
| Journal Title | Physical Review B |
| Volume | 78 |
| Pages | 155416 |
| Date Published | 10/01 |
| Type of Article | Article |
| ISBN Number | 1098-0121 |
| Accession Number | ISI:000260574400124 |
| Keywords | ag, AL-CU-FE, energy, fivefold surface, nucleation, photoemission, refinement |
| Abstract | We present a comprehensive study of Bi thin-film growth on quasicrystal surfaces. The substrates used for the growth are the fivefold surface of icosahedral (i)-Al-Cu-Fe and i-Al-Pd-Mn and the tenfold surface of decagonal (d)-Al-Ni-Co quasicrystals. The growth is investigated at 300 and 525 K substrate temperatures and at different coverage (theta) ranging from submonolayer to ten monolayers. The film is characterized by scanning tunneling microscopy, reflection high-energy electron diffraction, and x-ray photoelectron spectroscopy. At 300 K, the deposited Bi yields a quasicrystalline film for theta <= 1. For 1 |
| DOI | 10.1103/PhysRevB.78.155416 |
| Alternate Journal | Phys. Rev. B |
