Microstructure dependence of the c-axis critical current density in second-generation YBCO tapes
| Title | Microstructure dependence of the c-axis critical current density in second-generation YBCO tapes |
| Publication Type | Journal Article |
| Year of Publication | 2011 |
| Authors | Jia Y, Welp U, Crabtree GW, Kwok WK, Malozemoff AP, Rupich MW, Fleshler S, Clem JR |
| Journal Title | Journal of Applied Physics |
| Volume | 110 |
| Pages | 083923 |
| Date Published | 10 |
| Type of Article | Article |
| ISBN Number | 0021-8979 |
| Accession Number | WOS:000296519900105 |
| Keywords | coated conductors, dy additions, flux-creep, high-temperature superconductors, ii superconductors, inhomogeneity, n-value, resistive transition, WIRES, yba2cu3o7-delta |
| Abstract | C-axis current flow in high temperature superconductor (HTS) tape-shaped wires arises in configurations where the local wire axis is not perpendicular to the local magnetic field, such as in power cables with helically wound HTS tapes. The c-axis critical current density J(c)(c) has been recently found to be orders of magnitude lower than the ab-plane critical current density J(c)(ab). Here we report on J(c)(c) (77 K, sf) values of various YBa(2)Cu(3)O(7)-based (YBCO) tapes with different microstructures. Our results show that the value of J(c)(c) (77 K, sf) decreases significantly with increasing concentration of ab-plane stacking faults in YBCO thin films and that the critical current anisotropy gamma = J(c)(ab)/J(c)(c) can reach values as high as 2070, implying that in the highest-anisotropy tape, similar to 20% of the tape width carries c-axis current in a helically wound power cable. VC 2011 American Institute of Physics. [doi:10.1063/1.3653292] |
| DOI | 10.1063/1.3653292 |
| Alternate Journal | J. Appl. Phys. |
