Charge-magnetic interference resonant scattering studies of ferromagnetic crystals and thin films
| Title | Charge-magnetic interference resonant scattering studies of ferromagnetic crystals and thin films |
| Publication Type | Journal Article |
| Year of Publication | 2012 |
| Authors | Haskel D, Kravtsov E, Choi Y, Lang JC, Islam Z, Srajer G, Jiang JS, Bader SD, Canfield PC |
| Journal Title | European Physical Journal-Special Topics |
| Volume | 208 |
| Pages | 141-155 |
| Date Published | 06 |
| Type of Article | Review |
| ISBN Number | 1951-6355 |
| Accession Number | WOS:000305404200015 |
| Keywords | diffraction, exchange scattering, nd2fe14b, phase-transitions, polarization dependence, rough surfaces, superlattices, x-ray-scattering |
| Abstract | The element- and site-specificity of X-ray resonant magnetic scattering (XRMS) makes it an ideal tool for furthering our understanding of complex magnetic systems. In the hard X-rays, XRMS is readily applied to most antiferromagnets where the relatively weak resonant magnetic scattering (10(-2)-10(-6) I (c) ) is separated in reciprocal space from the stronger, Bragg charge scattered intensity, I (c) . In ferro(ferri)magnetic materials, however, such separation does not occur and measurements of resonant magnetic scattering in the presence of strong charge scattering are quite challenging. We discuss the use of charge-magnetic interference resonant scattering for studies of ferromagnetic (FM) crystals and layered films. We review the challenges and opportunities afforded by this approach, particularly when using circularly polarized X-rays. We illustrate current capabilities at the Advanced Photon Source with studies aimed at probing site-specific magnetism in ferromagnetic crystals, and interfacial magnetism in films. |
| URL | <Go to ISI>://WOS:000305404200015 |
| DOI | 10.1140/epjst/e2012-01615-2 |
| Alternate Journal | Eur. Phys. J.-Spec. Top. |
