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Effective material parameter retrieval for thin sheets: Theory and application to graphene, thin silver films, and single-layer metamaterials

TitleEffective material parameter retrieval for thin sheets: Theory and application to graphene, thin silver films, and single-layer metamaterials
Publication TypeJournal Article
Year of Publication2012
AuthorsTassin P, Koschny T, Soukoulis C
Journal TitlePhysica B-Condensed Matter
Volume407
Pages4062-4065
Date Published10
Type of ArticleArticle; Proceedings Paper
ISBN Number0921-4526
Accession NumberWOS:000308907300012
Keywordsanalog, Effective medium, graphene, index, metamaterials, permeability, permittivity, refraction, retrieval, silver, thin film
Abstract

An important tool in the field of metamaterials is the extraction of effective material parameters from simulated or measured scattering parameters of a sample. Here we discuss a retrieval method for thin-film structures that can be approximated by a two-dimensional scattering sheet. We determine the effective sheet conductivity from the scattering parameters and we point out the importance of the magnetic sheet current to avoid an overdetermined inversion problem. Subsequently, we present two applications of the sheet retrieval method. First, we determine the effective sheet conductivity of thin silver films and we compare the resulting conductivities with the sheet conductivity of graphene. Second, we apply the method to a cut-wire metamaterial with an electric dipole resonance. The method is valid for thin-film structures such as two-dimensional metamaterials and frequency-selective surfaces and can be easily generalized for anisotropic or chiral media. (c) 2012 Elsevier B.V. All rights reserved.
URL<Go to ISI>://WOS:000308907300012
DOI10.1016/j.physb.2012.01.119
Alternate JournalPhysica B