CHEMICAL AND BIOLOGICAL SCIENCES
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Robert S. Houk Senior Chemist B27 Spedding Hall |
PERSONAL HISTORY
RESEARCH INTERESTS
Inorganic mass spectrometry, ICP mass spectrometry, electrospray mass spectrometry, elemental speciation, basic studies of analytical plasmas.
RECENT PUBLICATIONS
R. S. Houk, V. A. Fassel, G. D. Flesch, H. J. Svec, A. L. Gray and C. E. Taylor, “Inductively Coupled Argon Plasma as an Ion Source for Mass Spectrometric Determination of Trace Elements”, Anal. Chem.52, 2283-2289 (1980).
L.-Q. Huang, R. J. Conzemius, G. A. Junk and R. S. Houk, “Ion Association by Time-of-Flight Mass Spectrometry”, Int. J. Mass Spectrom. Ion Processes, 1989, 90, 85-96.
J. T. Rowan and R. S. Houk, “Attenuation of Polyatomic Ion Interferences by Gas Phase Collision Processes,” Appl. Spectrosc., 1989, 43, 976-980.
M. H. Amad and R. S. Houk, “Mass Resolution of 11,000 to 22,000 with a Multiple Pass Quadrupole Mass Analyzer,” J. Amer. Soc. Mass Spectrom. 2000, 11, 407-415.
N. Praphairaksit and R. S. Houk, “Attenuation of Matrix Effects in ICP-MS with a Supplemental Electron Source Inside the Skimmer,” Anal. Chem. 2000, 72, 2351-2356.